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The Tilted Wave Interferometer (TWI): A quick and flexible approach to measure aspheric and freeform surfaces

Baer G., Schindler J., Pruss C., Osten W.
Keywords:

Metrology, Aspheres, Free-Forms, Tilted-Wave-Interferometer, Non-Null

Document type Proceedings
Journal title / Source Proceedings to 28th Annual Meeting of the American Society for Precision Engineering
Volume 28
Publication date 2013
Conference name 28th Annual Meeting of the American Society for Precision Engineering
Conference date 20 - 25 October 2013
Conference place St. Paul, MN, USA
Web URL http://www.aspe.net/publications/Short%20Abstracts%2013A/3807.pdf

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Information

Name of Call / Funding Programme
EMRP A169: Call 2010 Industry