The Tilted Wave Interferometer (TWI): A quick and flexible approach to measure aspheric and freeform surfaces
Baer G., Schindler J., Pruss C., Osten W.Metrology, Aspheres, Free-Forms, Tilted-Wave-Interferometer, Non-Null
| Document type | Proceedings |
| Journal title / Source | Proceedings to 28th Annual Meeting of the American Society for Precision Engineering |
| Volume | 28 |
| Publication date | 2013 |
| Conference name | 28th Annual Meeting of the American Society for Precision Engineering |
| Conference date | 20 - 25 October 2013 |
| Conference place | St. Paul, MN, USA |
| Web URL | http://www.aspe.net/publications/Short%20Abstracts%2013A/3807.pdf |