The Tilted Wave Interferometer (TWI): A quick and flexible approach to measure aspheric and freeform surfaces
Baer G., Schindler J., Pruss C., Osten W.Metrology, Aspheres, Free-Forms, Tilted-Wave-Interferometer, Non-Null
Document type | Proceedings |
Journal title / Source | Proceedings to 28th Annual Meeting of the American Society for Precision Engineering |
Volume | 28 |
Publication date | 2013 |
Conference name | 28th Annual Meeting of the American Society for Precision Engineering |
Conference date | 20 - 25 October 2013 |
Conference place | St. Paul, MN, USA |
Web URL | http://www.aspe.net/publications/Short%20Abstracts%2013A/3807.pdf |