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On Wafer Millimetre Wave Power Detection Using a PN Junction Diode in BiCMOS 55 nm for In-Situ Large Signal Characterization

Azevedo Goncalves, Joao Carlos, Alaji, Issa, Gloria, Daniel, Gidel, Vincent, Gianesello, Frederic, Lepilliet, Sylvie, Ducournau, Guillaume, Danneville, Francois and Gaquiere, C.
Keywords:

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Document typeProceeding
Journal title / Source2018 48th European Microwave Conference (EuMC)
Volume-
Issue-
Page numbers / Article number-
Publisher's nameIEEE
Publication date 2018-09
Conference nameOn Wafer Millimetre Wave Power Detection Using a PN Junction Diode in BiCMOS 55 nm for In-Situ Large Signal Characterization
Conference date23-09-2018 to 27-09-2018
Conference placeMadrid Spain
ISSN-
DOI10.23919/EuMC.2018.8541387
ISBN978-2-87487-051-4
Web URLhttps://zenodo.org/record/4294934#.X8XOjs1Kg2z
LanguageEnglish

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