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On Wafer Millimetre Wave Power Detection Using a PN Junction Diode in BiCMOS 55 nm for In-Situ Large Signal Characterization

Azevedo Goncalves Joao Carlos, Alaji Issa, Gloria Daniel, Gidel Vincent, Gianesello Frederic, Lepilliet Sylvie, Ducournau Guillaume, Danneville Francois, Gaquiere C.
Keywords:

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Document type Proceedings
Journal title / Source 2018 48th European Microwave Conference (EuMC)
Volume -
Issue -
Page numbers / Article number -
Publisher's name IEEE
Publication date 2018-9
Conference name On Wafer Millimetre Wave Power Detection Using a PN Junction Diode in BiCMOS 55 nm for In-Situ Large Signal Characterization
Conference date 23-09-2018 to 27-09-2018
Conference place Madrid Spain
ISSN -
DOI 10.23919/EuMC.2018.8541387
ISBN 978-2-87487-051-4
Web URL https://zenodo.org/record/4294934#.X8XOjs1Kg2z
Language English

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Information

Project title (JRP)
16ENG06: ADVENT: Metrology for advanced energy-saving technology in next-generation electronics applications
Name of Call / Funding Programme
EMPIR 2016: Energy