On Wafer Millimetre Wave Power Detection Using a PN Junction Diode in BiCMOS 55 nm for In-Situ Large Signal Characterization
Azevedo Goncalves Joao Carlos, Alaji Issa, Gloria Daniel, Gidel Vincent, Gianesello Frederic, Lepilliet Sylvie, Ducournau Guillaume, Danneville Francois, Gaquiere C.-
| Document type | Proceedings |
| Journal title / Source | 2018 48th European Microwave Conference (EuMC) |
| Volume | - |
| Issue | - |
| Page numbers / Article number | - |
| Publisher's name | IEEE |
| Publication date | 2018-9 |
| Conference name | On Wafer Millimetre Wave Power Detection Using a PN Junction Diode in BiCMOS 55 nm for In-Situ Large Signal Characterization |
| Conference date | 23-09-2018 to 27-09-2018 |
| Conference place | Madrid Spain |
| ISSN | - |
| DOI | 10.23919/EuMC.2018.8541387 |
| ISBN | 978-2-87487-051-4 |
| Web URL | https://zenodo.org/record/4294934#.X8XOjs1Kg2z |
| Language | English |