Comparison of Broadband Single-Sweep and Conventional Banded System On-Wafer S-Parameter Measurements up to 220 GHz
Ausden L., Ridler N., Rumiantsev A., Martens J., Shang X.Measurement comparison, millimeter-wave measurement, on-wafer measurement, S-parameters, vector network analyzer
| Document type | Proceedings |
| Journal title / Source | |
| Page numbers / Article number | 1-4 |
| Publisher's name | IEEE |
| Publisher's address (city only) | Piscataway |
| Publication date | 2025-1-1 |
| Conference name | 105th ARFTG Microwave Measurement Conference (ARFTG) |
| Conference date | 20 June 2025 |
| Conference place | San Fransisco, CA, USA |
| DOI | 10.5281/zenodo.17425562 |
| ISBN | 979-8-3315-9529-6 |
| Language | English |