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Atomic force microscope adhesion measurements and atomistic molecular dynamics simulations at different humidities

Seppä J, Reischl B, Sairanen H, Korpelainen V, Husu H, Heinonen M, Raiteri P, Rohl A, Nordlund K, Lassila A
Keywords:

Atomic force microscopy, metrology, adhesion, capillary effects, humidity, force measurement

Document type Article
Journal title / Source Measurement Science and Technology
Peer-reviewed article 1
Volume 28
Issue 3
Page numbers / Article number 034004 (10pp)
Publisher's name IOP Publishing
Publisher's address (city only) Bristol
Publication date 2017-1-23
ISSN 0957-0233
DOI 10.1088/1361-6501/28/3/034004
Web URL http://iopscience.iop.org/article/10.1088/1361-6501/28/3/034004/meta;jsessionid=1CDCAA65608F84971489636A33CB4FD2.c3.iopscience.cld.iop.org
Language English

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Information

Project title (JRP)
NEW05: MechProNO: Traceable measurement of mechanical properties of nano-objects
Name of Call / Funding Programme
EMRP A169: Call 2011 Metrology for New Technologies