Atomic force microscope adhesion measurements and atomistic molecular dynamics simulations at different humidities
Seppä J, Reischl B, Sairanen H, Korpelainen V, Husu H, Heinonen M, Raiteri P, Rohl A, Nordlund K, Lassila AAtomic force microscopy, metrology, adhesion, capillary effects, humidity, force measurement
| Document type | Article |
| Journal title / Source | Measurement Science and Technology |
| Peer-reviewed article | 1 |
| Volume | 28 |
| Issue | 3 |
| Page numbers / Article number | 034004 (10pp) |
| Publisher's name | IOP Publishing |
| Publisher's address (city only) | Bristol |
| Publication date | 2017-1-23 |
| ISSN | 0957-0233 |
| DOI | 10.1088/1361-6501/28/3/034004 |
| Web URL | http://iopscience.iop.org/article/10.1088/1361-6501/28/3/034004/meta;jsessionid=1CDCAA65608F84971489636A33CB4FD2.c3.iopscience.cld.iop.org |
| Language | English |