Development and Evaluation of an Improved Apparatus for Measuring the Emissivity at High Temperatures

Arduini M., Manara J., Stark T., Ebert H-P., Hartmann J.

emissivity, reflectivity, infrared radiation, high temperature, FTIR-spectrometer, blackbody,uncertainty, X-point, inductive heating, direct radiative method

Document type Article
Journal title / Source Sensors
Volume 21
Issue 18
Page numbers / Article number 6252
Publisher's name MDPI AG
Publication date 2021-9-17
ISSN 1424-8220
DOI 10.3390/s21186252
Language English

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