Analytical modeling and three-dimensional finite element simulation of line edge roughness in scatterometry

Kato A., Burger S., Scholze F.
Document type Article
Journal title / Source APPLIED OPTICS
Volume 51
Issue 27
Page numbers / Article number 6457 - 6464
Publication date 2012-9-11
DOI 10.1364/AO.51.006457
Language English

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