Alternative Conducted Immunity Tests

Çakır Soydan, Şen Osman, ACAK Savaş, AZPURUA Marco, SILVA Ferran, Çetintaş Mustafa
Keywords:

Alternative, Current Probe, CDN, Conducted Immunity, EMC, High Current, Industry, Mains Impedance

Document type Article
Journal title / Source IEEE Electromagnetic Compatibility Magazine
Peer-reviewed article 1
Volume 5
Issue 3
Page numbers / Article number 45-51
Publisher's name IEEE
Publisher's address (city only) USA
Publication date 2016-12-15
ISSN 2162-2272
DOI 10.1109/MEMC.0.7764249
Web URL http://ieeexplore.ieee.org/document/7764249/
Language English

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