Assessment and Improvement of the Pattern Recognition Performance of Memdiode-Based Cross-Point Arrays with Randomly Distributed Stuck-at-Faults

Aguirre F.L., Pazos S.M., Palumbo F., Morell A., Suñé J., Miranda E.
Keywords:

stuck-at fault; RRAM; pattern recognition; memristor; QMM; neural network; neuromorphics

Document type Article
Journal title / Source Electronics
Volume 10
Issue 19
Page numbers / Article number 2427
Publisher's name MDPI AG
Publication date 2021-10
ISSN 2079-9292
DOI 10.3390/electronics10192427
Web URL https://www.mdpi.com/2079-9292/10/19/2427
Language English

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