Fast Fitting of the Dynamic Memdiode Model to the Conduction Characteristics of RRAM Devices Using Convolutional Neural Networks

Aguirre F.L., Alff L., Suñé J., Hochberger C., Oster T., Gehrunger J., Petzold S., Vogel T., Kaiser N., Piros E., Miranda E.
Keywords:

RRAM, neural networks, curve fitting, dynamic memdiode, memristor

Document type Article
Journal title / Source Micromachines
Volume 13
Issue 11
Page numbers / Article number 2002
Publisher's name MDPI AG
Publisher's address (city only) Basel, Switzerland
Publication date 2022-11-17
ISSN 2072-666X
DOI 10.3390/mi13112002
Language English

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