Advances in Large Scale Metrology – Review and Future Trends

Schmitt R., Peterek M., Morse E., Knapp W., Galetto M., Härtig F., Goch G., Hughes B., Forbes A., Estler W.T.

Metrology, Measuring Instrument, Uncertainty, Simulation, Modelling, Information

Document type Article
Journal title / Source CIRP Annals Manufacturing Technology
Peer-reviewed article 1
Volume 65/I
Issue 2016
Page numbers / Article number 643-665
Publisher's name Elsevier
Publisher's address (city only) Oxford
Publication date 2016-8
DOI 10.1016/j.cirp.2016.05.002
Language English

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