Advances in Large Scale Metrology – Review and Future Trends
Schmitt R., Peterek M., Morse E., Knapp W., Galetto M., Härtig F., Goch G., Hughes B., Forbes A., Estler W.T.Metrology, Measuring Instrument, Uncertainty, Simulation, Modelling, Information
| Document type | Article |
| Journal title / Source | CIRP Annals Manufacturing Technology |
| Peer-reviewed article | 1 |
| Volume | 65/I |
| Issue | 2016 |
| Page numbers / Article number | 643-665 |
| Publisher's name | Elsevier |
| Publisher's address (city only) | Oxford |
| Publication date | 2016-8 |
| DOI | 10.1016/j.cirp.2016.05.002 |
| Web URL | http://www.sciencedirect.com/science/article/pii/S0007850616301895 |
| Language | English |