Accurate measurement of enhancement factor in tip-enhanced Raman spectroscopy through elimination of far-field artefacts
Kumar N., Rae A., Roy D.| Document type | Article |
| Journal title / Source | Applied Physics Letters |
| Peer-reviewed article | 1 |
| Volume | 104 |
| Issue | 12 |
| Page numbers / Article number | 123106 |
| Publisher's name | AIP Scitation |
| Publisher's address (city only) | American Institute of Physics |
| Publication date | 2014-12-28 |
| ISSN | 0003-6951 |
| DOI | 10.1063/1.4869184 |
| Web URL | http://scitation.aip.org/content/aip/journal/apl/104/12/10.1063/1.4869184 |
| Language | English |