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More insight into conducted immunity tests and investigation of support influences

Şen O., Çakır S., Acak S.
Keywords:

CDN, Conducted Immunity, EMC, Loop Impedance, Support

Document type Proceedings
Journal title / Source 2017 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)
Volume 2017
Issue 2017
Page numbers / Article number 124-126
Publisher's name IEEE
Publication date 2017-7-13
Conference name 2017 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)
Conference date 20-06-2017 to 23-06-2017
Conference place Seoul
DOI 10.1109/APEMC.2017.7975442
Web URL http://rfmw.cmi.cz/documents/papers/Sen_APEMC2017_OA.pdf
Language English

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Information

Project title (JRP)
15RPT01: RFMicrowave: Development of RF and microwave metrology capability
Name of Call / Funding Programme
EMPIR 2015: Research Potential