More insight into conducted immunity tests and investigation of support influences
Şen O., Çakır S., Acak S.CDN, Conducted Immunity, EMC, Loop Impedance, Support
| Document type | Proceedings |
| Journal title / Source | 2017 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) |
| Volume | 2017 |
| Issue | 2017 |
| Page numbers / Article number | 124-126 |
| Publisher's name | IEEE |
| Publication date | 2017-7-13 |
| Conference name | 2017 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) |
| Conference date | 20-06-2017 to 23-06-2017 |
| Conference place | Seoul |
| DOI | 10.1109/APEMC.2017.7975442 |
| Web URL | http://rfmw.cmi.cz/documents/papers/Sen_APEMC2017_OA.pdf |
| Language | English |