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A study of the reference impedance influence on a TRL calibration

Kuhlmann K.
Keywords:

Network analysis, calibration, impedance, metrology.

Document type Proceedings
Journal title / Source Proceedings 87th ARFTG Microwave Measurement Conference
Peer-reviewed article 1
Volume n.a.
Issue n.a.
Page numbers / Article number 1-4
Publisher's name IEEE
Publisher's address (city only) Danvers,
Publication date 2016-5-27
Conference name 87th ARFTG Microwave Measurement Conference
Conference date 27-05-2016
Conference place San Francisco
ISSN n.a.
DOI 10.1109/ARFTG.2016.7501969
ISBN 978-1-5090-1308-1
Language English

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Information

Project title (JRP)
SIB62: HFCircuits: Metrology for new electrical measurement quantities in high-frequency circuits
Name of Call / Funding Programme
EMRP A169: Call 2012 SI Broader scope (II)