A self-referenced single-electron current source

Hohls F., Fricke L., Wulf M., Kaestner B., Mirovsky Ph., Mackrodt B., Dolata R., Weimann Th., Pierz K., Siegner U., Schumacher H. W.
Keywords:

Charge pumps, Current measurement, Error accounting, Single electron devices, Single electron transistors

Document type Proceedings
Journal title / Source Conference on Precision Electromagnetic Measurements (CPEM) Digest 2014, IEEE Catalog Number: CFP14PEM-CDR
Page numbers / Article number 665-665
Publication date 2014
Conference name Conference on Precision Electromagnetic Measurements
Conference date 24-29 August 2014
Conference place Rio de Janeiro
ISBN 978-1-4799-2478-3
Language English

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