A Nonlinear Verification Device for Nonlinear Vector Network Analyzers
Humphreys D. A., Rajabi M., Schreur D., Nielsen T.Impedance matching, electromagnetic modeling, measurement uncertainty, microwave integrated circuits, nonlinear network analysis, semiconductor diodes.
Document type | Proceedings |
Journal title / Source | Proceedings Conference on Precision Electromagnetic Measurements 2016 |
Peer-reviewed article | 1 |
Volume | 1 |
Issue | 1 |
Page numbers / Article number | 1-2 |
Publisher's name | IEEE |
Publisher's address (city only) | Piscataway |
Publication date | 2016-7-10 |
Conference name | Conference on Precision Electromagnetic Measurements |
Conference date | 10-07-2016 to 16-07-2016 |
Conference place | Westin Hotel, Ottawa, Ontario, Canada |
ISSN | 05891485 |
DOI | 10.1109/CPEM.2016.7540467 |
ISBN | N/A |
Web URL | http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7540467&isnumber=7539723 |
Language | English |