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A Nonlinear Verification Device for Nonlinear Vector Network Analyzers

Humphreys D. A., Rajabi M., Schreur D., Nielsen T.

Impedance matching, electromagnetic modeling, measurement uncertainty, microwave integrated circuits, nonlinear network analysis, semiconductor diodes.

Document type Proceedings
Journal title / Source Proceedings Conference on Precision Electromagnetic Measurements 2016
Peer-reviewed article 1
Volume 1
Issue 1
Page numbers / Article number 1-2
Publisher's name IEEE
Publisher's address (city only) Piscataway
Publication date 2016-7-10
Conference name Conference on Precision Electromagnetic Measurements
Conference date 10-07-2016 to 16-07-2016
Conference place Westin Hotel, Ottawa, Ontario, Canada
ISSN 05891485
DOI 10.1109/CPEM.2016.7540467
Language English

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Project title (JRP)
SIB62: HFCircuits: Metrology for new electrical measurement quantities in high-frequency circuits
Name of Call / Funding Programme
EMRP A169: Call 2012 SI Broader scope (II)