A Nonlinear Verification Device for Nonlinear Vector Network Analyzers
Humphreys D. A., Rajabi M., Schreur D., Nielsen T.Impedance matching, electromagnetic modeling, measurement uncertainty, microwave integrated circuits, nonlinear network analysis, semiconductor diodes.
| Document type | Proceedings |
| Journal title / Source | Proceedings Conference on Precision Electromagnetic Measurements 2016 |
| Peer-reviewed article | 1 |
| Volume | 1 |
| Issue | 1 |
| Page numbers / Article number | 1-2 |
| Publisher's name | IEEE |
| Publisher's address (city only) | Piscataway |
| Publication date | 2016-7-10 |
| Conference name | Conference on Precision Electromagnetic Measurements |
| Conference date | 10-07-2016 to 16-07-2016 |
| Conference place | Westin Hotel, Ottawa, Ontario, Canada |
| ISSN | 05891485 |
| DOI | 10.1109/CPEM.2016.7540467 |
| ISBN | N/A |
| Web URL | http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7540467&isnumber=7539723 |
| Language | English |