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A Nonlinear Verification Device for Nonlinear Vector Network Analyzers

Humphreys D. A., Rajabi M., Schreur D., Nielsen T.
Keywords:

Impedance matching, electromagnetic modeling, measurement uncertainty, microwave integrated circuits, nonlinear network analysis, semiconductor diodes.

Document type Proceedings
Journal title / Source Proceedings Conference on Precision Electromagnetic Measurements 2016
Peer-reviewed article 1
Volume 1
Issue 1
Page numbers / Article number 1-2
Publisher's name IEEE
Publisher's address (city only) Piscataway
Publication date 2016-7-10
Conference name Conference on Precision Electromagnetic Measurements
Conference date 10-07-2016 to 16-07-2016
Conference place Westin Hotel, Ottawa, Ontario, Canada
ISSN 05891485
DOI 10.1109/CPEM.2016.7540467
ISBN N/A
Web URL http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7540467&isnumber=7539723
Language English

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Information

Project title (JRP)
SIB62: HFCircuits: Metrology for new electrical measurement quantities in high-frequency circuits
Name of Call / Funding Programme
EMRP A169: Call 2012 SI Broader scope (II)