A new Conducted Immunity Test Device for Inter-Laboratory Comparisons

Tas Emrah, Pythoud Frédéric
Keywords:

Electromagnetic Compatibility (EMC), IEC 61000-4-6, round robin, immunity, common mode, conducted, current clamp, Radio Frequency (RF) meter, Coupling-Decoupling Network (CDN), inter-laboratory comparison, Equipment under Test (EUT).

Document type Proceedings
Journal title / Source IEEE International Symposium on Electromagnetic Compatibility and EMC Europe Proceedings
Peer-reviewed article 1
Volume 1
Issue 1
Page numbers / Article number 855-860
Publisher's name IEEE
Publisher's address (city only) Piscataway, USA
Publication date 2015-8-22
Conference name IEEE International Symposium on Electromagnetic Compatibility and EMC Europe
Conference date 16-08-2015 to 22-08-2015
Conference place Dresden / Germany
ISSN 2158-110X
ISBN 978-1-4799-6615-8
Web URL http://conference.vde.com/emc2015/Pages/default.aspx
Language English

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