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A Method for De-Embedding Cable Flexure Errors in S-parameter Measurements

Mubarak F.A., Rietveld G., Spirito M.
Keywords:

Index Terms — S-parameters, cable errors, VNA, PNA, cable flexure, impedance, de-embedding, measurement techniques, RF.

Document type Proceedings
Journal title / Source Microwave Measurement Conference (ARFTG), 2014
Peer-reviewed article 1
Volume n/a
Issue 83rd ARFTG proceedings
Page numbers / Article number 1-5
Publisher's name IEEE
Publisher's address (city only) n/a
Publication date 2014-6-6
ISSN n/a
DOI 10.1109/ARFTG.2014.6899529
Language English

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Information

Project title (JRP)
SIB62: HFCircuits: Metrology for new electrical measurement quantities in high-frequency circuits
Name of Call / Funding Programme
EMRP A169: Call 2012 SI Broader scope (II)