A high resolution set up devoted to the measurement of the Bidirectional Reflectance Distribution Function around the specular peak, at LNE-CNAM.
Ouarets S., Leroux L., Bernard R., Razet A., Obein G.BRDF, goniospectrophotometer, gloss, specular, peak
| Document type | Article |
| Journal title / Source | Proceedings of the 16th International Congress of Metrology |
| Volume | 2013 |
| Page numbers / Article number | 14008 |
| Publisher's name | EDP Sciences |
| Publisher's address (city only) | Paris |
| Publication date | 2013-10-7 |
| DOI | 10.1051/metrology/201314008 |
| Language | English |