A calibration procedure for electronic calibration units
Stenarson J, Eio C, Yhland KVector Network Analyzer (VNA), calibration, metrology, uncertainties, ripple technique
| Document type | Proceedings |
| Journal title / Source | 84th ARFTG Microwave Measurement Conference |
| Peer-reviewed article | 1 |
| Volume | 84 |
| Issue | n/a |
| Page numbers / Article number | n/a |
| Publisher's name | IEEE |
| Publisher's address (city only) | Melville |
| Publication date | 2015-1-19 |
| Conference name | 84th ARFTG Microwave Measurement Conference |
| Conference date | 04-12-2014 to 05-12-2015 |
| Conference place | Boulder, Colorado, USA |
| ISSN | n/a |
| DOI | 10.1109/ARFTG.2014.7013414 |
| ISBN | 978-1-4799-7085-8 |
| Web URL | http://ieeexplore.ieee.org/document/7013414/ |
| Language | English |