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A calibration procedure for electronic calibration units

Stenarson J, Eio C, Yhland K
Keywords:

Vector Network Analyzer (VNA), calibration, metrology, uncertainties, ripple technique

Document type Proceedings
Journal title / Source 84th ARFTG Microwave Measurement Conference
Peer-reviewed article 1
Volume 84
Issue n/a
Page numbers / Article number n/a
Publisher's name IEEE
Publisher's address (city only) Melville
Publication date 2015-1-19
Conference name 84th ARFTG Microwave Measurement Conference
Conference date 04-12-2014 to 05-12-2015
Conference place Boulder, Colorado, USA
ISSN n/a
DOI 10.1109/ARFTG.2014.7013414
ISBN 978-1-4799-7085-8
Web URL http://ieeexplore.ieee.org/document/7013414/
Language English

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Information

Project title (JRP)
SIB62: HFCircuits: Metrology for new electrical measurement quantities in high-frequency circuits
Name of Call / Funding Programme
EMRP A169: Call 2012 SI Broader scope (II)