A calibration procedure for electronic calibration units
Stenarson J, Eio C, Yhland KVector Network Analyzer (VNA), calibration, metrology, uncertainties, ripple technique
Document type | Proceedings |
Journal title / Source | 84th ARFTG Microwave Measurement Conference |
Peer-reviewed article | 1 |
Volume | 84 |
Issue | n/a |
Page numbers / Article number | n/a |
Publisher's name | IEEE |
Publisher's address (city only) | Melville |
Publication date | 2015-1-19 |
Conference name | 84th ARFTG Microwave Measurement Conference |
Conference date | 04-12-2014 to 05-12-2015 |
Conference place | Boulder, Colorado, USA |
ISSN | n/a |
DOI | 10.1109/ARFTG.2014.7013414 |
ISBN | 978-1-4799-7085-8 |
Web URL | http://ieeexplore.ieee.org/document/7013414/ |
Language | English |