This file was created by the TYPO3 extension bib --- Timezone: CEST Creation date: 2022-08-11 Creation time: 19-09-55 --- Number of references 27 article HuiMZAABBBBBBBBBBCCCCCCCCDdDDDDDDEEEEFFFGGGGHHHHHHHJJJJJKKLLLLLLLLMMMMMMMMMNNNNOOOPPPPPPPPPRRRRRROSSSSSSSSSSSSSTTTTTTTvVVVWWWWWWWWXLYZZZE2021 2336 NeuroImage 2021 11 241 18HLT09: Neuromet2: Metrology and innovation for early diagnosis and accurate stratification of patients with neurodegenerative diseases 118430 Magnetic resonance spectroscopy (MRS), Frequency drift, 3T, Press, Multi-vendor, Multi-site EMPIR 2018: Health Elsevier BV 30 1053-8119 10.1016/j.neuroimage.2021.118430 NA S.C.N.Hui M.Mikkelsen H.J.Zöllner V.Ahluwalia S.Alcauter L.Baltusis D.A.Barany L.R.Barlow R.Becker J.I.Berman A.Berrington P.K.Bhattacharyya J.U.Blicher W.Bogner M.S.Brown V.D.Calhoun R.Castillo K.M.Cecil Y.B.Choi W.C.W.Chu W.T.Clarke A.R.Craven K.Cuypers M.Dacko C.de la Fuente-Sandoval P.Desmond A.Domagalik J.Dumont N.W.Duncan U.Dydak K.Dyke D.A.Edmondson 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W.R.Willoughby M.Wilson H-J.Wittsack A.J.Woods Y-C.Wu J.Xu M.Y.Lopez D.K.W.Yeung Q.Zhao X.Zhou G.Zupan R.A.E.Edden article YeZR2021 2533 IEEE Transactions on Instrumentation and Measurement 2021 70 17NRM01: TrafoLoss: Loss Measurements on Power Transformers and Reactors 1-9 Uncertainty, Voltage measurement, Calibration, Capacitors, Current measurement, Power transformers,Loss measurement SEG EMPIR 2017: Pre-Co-Normative Institute of Electrical and Electronics Engineers (IEEE) 30 0018-9456, 1557-9662 10.1109/TIM.2021.3056647 NA G.Ye W.Zhao G.Rietveld proceedings RietveldZY2020 2534 2020 Conference on Precision Electromagnetic Measurements (CPEM) 2020 8 17NRM01: TrafoLoss: Loss Measurements on Power Transformers and Reactors voltage divider, calibration, high voltage, voltage transformer, uncertainty, loss measurement, power transformer SEG https://zenodo.org/record/5997015 EMPIR 2017: Pre-Co-Normative IEEE Denver, CO, USA 2020 Conference on Precision Electromagnetic Measurements 24-08-2020 to 28-08-2020 30 2160-0171 10.1109/CPEM49742.2020.9191889 NA G.Rietveld W.Zhao G.Ye article MaZWDWLLWGLT2020 1899 Remote Sensing 2020 5 26 12 11 16ENV03: MetEOC-3: Further metrology for earth observation and climate 1696 RadCalNet, Cal/Val, calibration, uncertainty, metrology, Baotou, CEOS, interoperability, BTCN, BSCN EMPIR 2016: Environment MDPI AG 30 2072-4292 10.3390/rs12111696 NA LinglingMa YongguangZhao Emma R.Woolliams CaihongDai NingWang YaokaiLiu LingLi XinhongWang CaixiaGao ChuanrongLi LingliTang article PollathLLZZB2020 1761 Ultramicroscopy 2020 5 212 17FUN08: TOPS: Metrology for topological spin structures 112973 SkyrmionLorentz TEMPhase contrastMagnetic imaging https://arxiv.org/pdf/2002.12469.pdf EMPIR 2017: Fundamental Elsevier BV 30 0304-3991 10.1016/j.ultramic.2020.112973 NA S.Pöllath T.Lin N.Lei W.Zhao J.Zweck C.H.Back article JeneiPZTRTCSMD2019 1545 Physical Review Research 2019 12 10 1 3 15SIB08: e-SI-Amp: Quantum realisation of the SI ampere Waiting time distributions in a two-level fluctuator coupled to a superconducting charge detector EMPIR 2015: SI Broader Scope American Physical Society (APS) 30 2643-1564 10.1103/physrevresearch.1.033163 NA M.Jenei E.Potanina R.Zhao K.Y.Tan A.Rossi T.Tanttu K.W.Chan V.Sevriuk M.Möttönen A.Dzurak article VandervorstvAZFMMC2018 482 Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 2018 5 36 3 14IND01: 3DMetChemIT: Advanced 3D chemical metrology for innovative technologies 03F130 accuracy, composition, Atom probe, GaN https://avs.scitation.org/doi/10.1116/1.5019693 EMPIR 2014: Industry American Vacuum Society 30 2166-2746, 2166-2754 10.1116/1.5019693 NA R.J.H.Morris R.Cuduvally D.Melkonyan C.Fleischmann M.Zhao L.Arnoldi P.van der Heide W.Vandervorst article ChudnovskyPGWKGWHZBNZZZZ2018 582 Applied Physics Letters 2018 3 26 112 13 15SIB06: NanoMag: Nano-scale traceable magnetic field measurements 132405 magnetic skyrmion, magnetic force microscopy, stray field, perpendicular magnetic anisotropy http://hdl.handle.net/10754/627497 EMPIR 2015: SI Broader Scope AIP Publishing 30 0003-6951, 1077-3118 10.1063/1.5021172 NA X,Zhang S.Zhang J.Zhang Q.Zhang C.Barton V.Neu Y.Zhao Z.Hou Y.Wen C.Gong O.Kazakova W.Wang Y.Peng D.A.Garanin E.M.Chudnovsky article ZhouWLCZ2018 799 Loughborough Antennas & Propagation Conference 2018 2018 14IND10: MET5G: Metrology for 5G communications wireless communication, MIMO OTA test, link performance, SINR, uncertainty. EMPIR 2014: Industry 30 NA http://arxiv.org/abs/1809.07826 Y.Zhou M.Wang T. H.Loh D.Cheadle Y.Zhao article ZhaoFLLC2018 867 CIRP Annals 2018 67 1 15SIB01: FreeFORM: Reference algorithms and metrology on aspherical and freeform lenses 539-542 Information, Surface, Characterization EMPIR 2015: SI Broader Scope Elsevier BV 30 0007-8506 10.1016/j.cirp.2018.04.002 NA C.F.Cheung M.Liu R.Leach X.Feng C.Zhao article ZhaoRGFHMKF2017 405 Physical Review Applied 2017 10 30 8 4 15SIB08: e-SI-Amp: Quantum realisation of the SI ampere Single electron pumps https://arxiv.org/abs/1703.04795 EMPIR 2015: SI Broader Scope American Physical Society (APS) 30 2331-7019 10.1103/PhysRevApplied.8.044021 NA R.Zhao A.Rossi S. P.Giblin J. D.Fletcher J.Fletcher F. E.Hudson M.Möttönen M.Kataoka article ZhaovH2017 1189 Measurement Science and Technology 2017 8 16 28 9 15SIB04: QuADC: Waveform metrology based on spectrally pure Josephson voltages 095004 AC Josephson voltage standard, impedance matching, simulation, error sources,uncertainty https://zenodo.org/record/3265687#.XWZRsuhKgdW EMPIR 2015: SI Broader Scope IOP Publishing 30 0957-0233, 1361-6501 10.1088/1361-6501/aa7aba NA D.Zhao H.E.van den Brom E.Houtzager article FanQYFZ2017 Microelectronics Reliability 2017 4 74 July 2017 ENG62: MESaIL: Metrology for efficient and safe innovative lighting 179–185 Phosphor-converted white LED, Chip scale packages, Multicolor phosphors, Thermal/luminescence characterization, Degradation mechanisms http://www.sciencedirect.com/science/article/pii/S0026271417301026 EMRP A169: Call 2013 Energy II dongsheng ZHAO

New York

30 0026-2714 10.1016/j.microrel.2017.04.012 NA X.Fan C.Qian C.Yu J.Fan G.ZHAO article RietveldZOBCL2016 Metrologia 2016 11 21 53 6 ENG62: MESaIL: Metrology for efficient and safe innovative lighting 1384-1394 uncertainty analysis, electrical measurement, solid-state lighting EMRP A169: Call 2013 Energy II IOP Publishing

Temple Circus, Temple Way, Bristol, BS1 6BE, United Kingdom

30 0026-1394, 1681-7575 10.1088/0026-1394/53/6/1384 NA GRietveld DZhao FOverney J-PBraun AChristensen TLippert proceedings 2016 IEEE International Workshop on Applied Measurements for Power Systems (AMPS) 2016 9 28 ENG63: GridSens: Sensor network metrology for the determination of electrical grid characteristics 13-18 Smart meter; state estimation; distribution system; measurement uncertainty; data aggregation SEG http://ieeexplore.ieee.org/document/7602805/ EMRP A169: Call 2013 Energy II IEEE

Piscataway, NJ 08855-1331 USA

Aachen, Germany 2016 IEEE International Workshop on Applied Measurements for Power Systems (AMPS) 28-30 September 2016 30 978-1-5090-2373-8 10.1109/AMPS.2016.7602805 1 No, EURAMET is never allowed to make the publication publicly available. F.Ni P.H.Nguyen J.F.G.Cobben H.E.van den Brom D.Zhao proceedings International Symposium and Exhibition on Electromagnetic Compatibility Proceedings 2016 9 10 1 1 IND60: EMC: Improved EMC test methods in industrial environments 1-100 Electromagnetic Compatibility (EMC), IEC 61000- 4-6, EN ISO 17025, EN ISO 17043, proficiency testing, round robin, test device, conducted immunity, common mode, disturbance signal, Coupling-Decoupling Network (CDN), inter-laboratory comparison, Equipment under Test (EUT), Auxiliary Equipment (AE). http://www.emceurope.org/2016/index.html EMRP A169: Call 2012 Metrology for Industry (II) IEEE

Piscataway, USA

Wroclaw / Poland EMC Europe 2016 Wroclaw International Symposium and Exhibition on Electromagnetic Compatibility 05-09-2016 to 09-09-2016 30 978-1-4799-6615-8 2158-110X 1 59 No, EURAMET is never allowed to make the publication publicly available. EmrahTas SoydanCakir MustafaCetintas PavelHamouz ThomasIsbring MihaKokalj DanielLopez UrbanLundgren DwiMandaris BorutPinter MartinPoriz MarcPous FrédéricPythoud OsmanSen FerranSilva MarekSvaboda BraiseTrincaz DongshengZhao article Surface Topography: Metrology and Properties 2016 2 29 4 2 NEW08: MetNEMS: Metrology with/for NEMS 025001 graphene, Raman spectroscopy, Metrology, scanning probe microscopy techniques http://iopscience.iop.org/article/10.1088/2051-672X/4/2/025001/pdf EMRP A169: Call 2011 Metrology for New Technologies IOP Publishing

Bristol

30 n/a 10.1088/2051-672X/4/2/025001 1 59 Yes, the publication is open access and EURAMET is permitted to upload an author's version (post-print) of the publication to the Repository on its website. RWang RPearce JGallop TPatel FZhao APollard NKlein RJackman AZurutuza LHao proceedings Proceeding of the 7th Asia-Pacific International Symposium on Electromagnetic Compatibility & Signal Integrity and Technical Exhibition (APEMC 2016) 2016 1 1 IND60: EMC: Improved EMC test methods in industrial environments WE-PM-I-TC02-6 Alternative test method, ATM, conducted emission http://ieeexplore.ieee.org/document/7522905/?arnumber=7522905&tag=1 EMRP A169: Call 2012 Metrology for Industry (II) APEMC Shenzhen, China The 7th Asia-Pacific International Symposium on Electromagnetic Compatibility & Signal Integrity and Technical Exhibition (APEMC 2016) 18-05-2016 to 21-05-2016 30 978-1-4673-9494-9 10.1109/APEMC.2016.7522905 1 59 No option selected D.Zhao S.Cakir O.Sen proceedings Proceedings of the 23rd International Conference and Exhibition on Electricity Distribution (CIRED), Lyon, France 2015 6 2015 - 14IND08: ElPow: Metrology for the electrical power industry 1-5 Loss measurement, Load loss, efficiency, losses, Ecodesign Directive, power transformers, reactors, ELPOW, high voltage, current transformers http://cired.net/publications/cired2015/papers/CIRED2015_1538_final.pdf EMPIR 2014: Industry International Conference and Exhibition on Electricity Distribution

-

Lyon, France International Conference and Exhibition on Electricity Distribution June 2015 30 - - 1 59 Yes, the publication is open access and EURAMET is permitted to upload an author's version (post-print) of the publication to the Repository on its website. GRietveld EHoutzager DZhao article ZhaoMRHHO2015_2 IEEE Transactions on Instrumentation and Measurement 2015 2 64 2 IND16: Ultrafast: Metrology for ultrafast electronics and high-speed communications 356-365 Covariance matrix, Fourier transforms, frequency-domain measurements, measurement uncertainty, principal component analysis (PCA), timebase drift correction, time-domain measurements, timing jitter, uncertainty propagation EMRP A169: Call 2010 Industry Institute of Electrical and Electronics Engineers (IEEE) 30 0018-9456, 1557-9662 10.1109/TIM.2014.2340640 NA D.Zhao F.A.Mubarak M.Rodriguez-Higuero P.M.Harris D.A.Humphreys K.Ojasalo proceedings Power Electronics and ECCE Asia (ICPE-ECCE Asia), 2015 9th International Conference on 2015 1 1 IND60: EMC: Improved EMC test methods in industrial environments 443-448 Electromagnetic interference (EMI), grid impedance, load impedance, in-situ measurement http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7167823&isnumber=7167754 EMRP A169: Call 2012 Metrology for Industry (II) IEEE

New York

Seoul, Korea 2015 9th International Conference on Power Electronics and ECCE Asia (ICPE-ECCE Asia) 1-5 June 2015 30 978-8-9570-8254-6 10.1109/ICPE.2015.7167823 1 59 Yes, EURAMET is permitted to upload an author's version (post-print) of the publication to the Repository on its website after an embargo period. The embargo period ends on 2016-1-1 JTan DZhao BFerreira article Proceedings of the IEEE International Symposium on EMC, Raleigh NC, 2014 2014 N.A. N.A. IND60: EMC: Improved EMC test methods in industrial environments 12-17 design, conducted emissions, reference source http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6898934 EMRP A169: Call 2012 Metrology for Industry (II) IEEE

Piscataway, NJ

30 2158-110X 10.1109/ISEMC.2014.6898934 1 59 No, EURAMET is never allowed to make the publication publicly available. D.Zhao G.Teunisse F.B.J.Leferink proceedings ZhaoR2012 Proceedings of CPEM 2012: Conference on Precision Electromagnetic Measurements 2012 ENG05: Lighting: Metrology for Solid State Lighting http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6250921 EMRP A169: Call 2009 Energy Washington, DC, USA CPEM 2012: Conference on Precision Electromagnetic Measurements 1 - 6 July 2012 English 0589-1485 10.1109/CPEM.2012.6250921 1 59 NA D.Zhao G.Rietveld article ZhaoRT2011 IEEE Transactions on Instrumentation and Measurement 2011 7 60 7 T4.J07: EMF and SAR: Traceable measurement of field strength and SAR for the Physical Agents Directive 2267-2274 Curve fitting , mean square parameter methods , permittivity measurement , scattering parameter , specific absorption rate (SAR) , transmission line theory , vector network analyzer (VNA) iMERA-Plus: Call 2007 Health English 1 59 NA DongshengZhao GertRietveld George M.Teunisse article RietveldZKHKdL2011 IEEE Transactions on Instrumentation and Measurement 2011 7 60 7 T4.J01: Power & Energy: Next generation of power and energy measuring techniques 2195-2201 Digital filters, Digital–analog conversion, digitizer, frequency response, phase measurement, power measurement, wideband power SEG iMERA-Plus: Call 2007 Electricity and Magnetism 1 59 NA GertRietveld DongshengZhao CharlotteKramer ErnestHoutzager OrlaKristensen Cyrillede Leffe TorstenLippert proceedings ZhaoRTM2011 Proceedings of the 10th International Conference of the European Bioelectromagnetic Association, EBEA 2011 2011 T4.J07: EMF and SAR: Traceable measurement of field strength and SAR for the Physical Agents Directive iMERA-Plus: Call 2007 Length Rome, Italy 10th International Conference of the European Bioelectromagnetic Association, EBEA 2011 21 - 24 February 2011 English 978-88-8286-231-2 1 59 NA D.Zhao G.Rietveld G.Teunisse F.Mubarak miscellaneous BackPLLZZ 1891 Ultramicroscopy 212 17FUN08: TOPS: Metrology for topological spin structures 112973 Skyrmions. Lorentz Transmission Electron Microscopy, Magnetic Imaging https://www.sciencedirect.com/science/article/abs/pii/S0304399119304279 EMPIR 2017: Fundamental Elsevier NA https://doi.org/10.5281/zenodo.4341787 C.Back S.Pöllath T.Lin N.Lei W.Zhao J.Zweck