This file was created by the TYPO3 extension bib --- Timezone: CEST Creation date: 2021-05-12 Creation time: 09-16-22 --- Number of references 3 article StrupinskiUOGPMPMPWKB2018 992 ACS Applied Materials & Interfaces 2018 8 21 10 37 16NRM01: GRACE: Developing electrical characterisation methods for future graphene electronics 31641-31647 conductivity; graphene; metrology; micro four-point probe; SiC; terahertz spectroscopy https://pubs.acs.org/doi/10.1021/acsami.8b11428 EMPIR 2016: Pre-Co-Normative American Chemical Society (ACS) 30 1944-8244, 1944-8252 10.1021/acsami.8b11428 NA P.R.Whelan V.Panchal D.H.Petersen D.M.A.Mackenzie C.Melios I.Pasternak J.Gallop F.W.Østerberg P.U. Jepsen W.Strupinski O.Kazakova P.Bøggild article NielsenO2017 International Journal of Thermophysics 2017 11 20 39 1 SIB64: METefnet: Metrology for moisture in materials Dew point, Moisture content, SI primary standard, Water content, Water mass fraction EMRP A169: Call 2012 SI Broader scope (II) Springer Nature 30 0195-928X, 1572-9567 10.1007/s10765-017-2325-4 NA J.Nielsen P.Østergaard article 17th International Congress of Metrology 2015 9 21 17th 2015 SIB64: METefnet: Metrology for moisture in materials 15003 Development - Moisture in materials http://cfmetrologie.edpsciences.org/articles/metrology/abs/2015/01/metrology_metr2015_15003/metrology_metr2015_15003.html EMRP A169: Call 2012 SI Broader scope (II) EDP Sciences

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30 NA 10.1051/metrology/20150015003 1 59 Yes, the publication is open access and EURAMET is permitted to upload an author's version (post-print) of the publication to the Repository on its website. SBell AAro FArpino SAytekin GCortellessa MDell’Isola ZFerenčíková VFernicola RGavioso EGeorgin MHeinonen DHudoklin LJalukse NKaraböce ILeito AMäkynen PMiao JNielsen INicolescu MRudolfová MOjanen-Saloranta PÖsterberg PØstergaard MRujan MSega RStrnad TVachova