This file was created by the TYPO3 extension bib --- Timezone: CEST Creation date: 2022-05-23 Creation time: 00-18-13 --- Number of references 4 article NissilaFKMIJBKKOBMGK2021 2138 Driving a low critical current Josephson junction array with a mode-locked laser Applied Physics Letters 2021 7 19 119 3 15SIB04: QuADC: Waveform metrology based on spectrally pure Josephson voltages 032601 Josephson voltage standard, Josephson effect, Superconducting device, Laser, Photodiode EMPIR 2015: SI Broader Scope AIP Publishing 30 0003-6951, 1077-3118 10.1063/5.0060804 NA J.Nissilä T.Fordell K.Kohopää E.Mykkänen P.Immonen R.N.Jabdaraghi E.Bardalen O.Kieler B.Karlsen P.A.Øhlckers R.Behr A.J.Manninen J.Govenius A.Kemppinen article StrupinskiUOGPMPMPWKB2018 992 Electrical Homogeneity Mapping of Epitaxial Graphene on Silicon Carbide ACS Applied Materials & Interfaces 2018 8 21 10 37 16NRM01: GRACE: Developing electrical characterisation methods for future graphene electronics 31641-31647 conductivity; graphene; metrology; micro four-point probe; SiC; terahertz spectroscopy https://pubs.acs.org/doi/10.1021/acsami.8b11428 EMPIR 2016: Pre-Co-Normative American Chemical Society (ACS) 30 1944-8244, 1944-8252 10.1021/acsami.8b11428 NA P.R.Whelan V.Panchal D.H.Petersen D.M.A.Mackenzie C.Melios I.Pasternak J.Gallop F.W.Østerberg P.U. Jepsen W.Strupinski O.Kazakova P.Bøggild article NielsenO2017 SI-Traceable Water Content Measurements in Solids, Bulks, and Powders International Journal of Thermophysics 2017 11 20 39 1 SIB64: METefnet: Metrology for moisture in materials Dew point, Moisture content, SI primary standard, Water content, Water mass fraction EMRP A169: Call 2012 SI Broader scope (II) Springer Nature 30 0195-928X, 1572-9567 10.1007/s10765-017-2325-4 NA J.Nielsen P.Østergaard article METefnet: developments in metrology for moisture in materials 17th International Congress of Metrology 2015 9 21 17th 2015 SIB64: METefnet: Metrology for moisture in materials 15003 Development - Moisture in materials http://cfmetrologie.edpsciences.org/articles/metrology/abs/2015/01/metrology_metr2015_15003/metrology_metr2015_15003.html EMRP A169: Call 2012 SI Broader scope (II) EDP Sciences
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30 NA 10.1051/metrology/20150015003 1 59 Yes, the publication is open access and EURAMET is permitted to upload an author's version (post-print) of the publication to the Repository on its website. SBell AAro FArpino SAytekin GCortellessa MDell’Isola ZFerenčíková VFernicola RGavioso EGeorgin MHeinonen DHudoklin LJalukse NKaraböce ILeito AMäkynen PMiao JNielsen INicolescu MRudolfová MOjanen-Saloranta PÖsterberg PØstergaard MRujan MSega RStrnad TVachova