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--- Timezone: CEST
Creation date: 2022-05-23
Creation time: 00-18-13
--- Number of references
4
article
NissilaFKMIJBKKOBMGK2021
2138
Driving a low critical current Josephson junction array with a mode-locked laser
Applied Physics Letters
2021
7
19
119
3
15SIB04: QuADC: Waveform metrology based on spectrally pure Josephson voltages
032601
Josephson voltage standard, Josephson effect, Superconducting device, Laser, Photodiode
EMPIR 2015: SI Broader Scope
AIP Publishing
30
0003-6951, 1077-3118
10.1063/5.0060804
NA
J.Nissilä
T.Fordell
K.Kohopää
E.Mykkänen
P.Immonen
R.N.Jabdaraghi
E.Bardalen
O.Kieler
B.Karlsen
P.A.Øhlckers
R.Behr
A.J.Manninen
J.Govenius
A.Kemppinen
article
StrupinskiUOGPMPMPWKB2018
992
Electrical Homogeneity Mapping of Epitaxial Graphene on Silicon Carbide
ACS Applied Materials & Interfaces
2018
8
21
10
37
16NRM01: GRACE: Developing electrical characterisation methods for future graphene electronics
31641-31647
conductivity; graphene; metrology; micro four-point probe; SiC; terahertz spectroscopy
https://pubs.acs.org/doi/10.1021/acsami.8b11428
EMPIR 2016: Pre-Co-Normative
American Chemical Society (ACS)
30
1944-8244, 1944-8252
10.1021/acsami.8b11428
NA
P.R.Whelan
V.Panchal
D.H.Petersen
D.M.A.Mackenzie
C.Melios
I.Pasternak
J.Gallop
F.W.Østerberg
P.U. Jepsen
W.Strupinski
O.Kazakova
P.Bøggild
article
NielsenO2017
SI-Traceable Water Content Measurements in Solids, Bulks, and Powders
International Journal of Thermophysics
2017
11
20
39
1
SIB64: METefnet: Metrology for moisture in materials
Dew point, Moisture content, SI primary standard, Water content, Water mass fraction
EMRP A169: Call 2012 SI Broader scope (II)
Springer Nature
30
0195-928X, 1572-9567
10.1007/s10765-017-2325-4
NA
J.Nielsen
P.Østergaard
article
METefnet: developments in metrology for moisture in materials
17th International Congress of Metrology
2015
9
21
17th
2015
SIB64: METefnet: Metrology for moisture in materials
15003
Development - Moisture in materials
http://cfmetrologie.edpsciences.org/articles/metrology/abs/2015/01/metrology_metr2015_15003/metrology_metr2015_15003.html
EMRP A169: Call 2012 SI Broader scope (II)
EDP Sciences
London
30
NA
10.1051/metrology/20150015003
1
59
Yes, the publication is open access and EURAMET is permitted to upload an author's version (post-print) of the publication to the Repository on its website.
SBell
AAro
FArpino
SAytekin
GCortellessa
MDell’Isola
ZFerenčíková
VFernicola
RGavioso
EGeorgin
MHeinonen
DHudoklin
LJalukse
NKaraböce
ILeito
AMäkynen
PMiao
JNielsen
INicolescu
MRudolfová
MOjanen-Saloranta
PÖsterberg
PØstergaard
MRujan
MSega
RStrnad
TVachova