The gateway to Europe's
integrated metrology community.


EMRP project on high-frequency electronic components wins Best Papers awards

These techniques will help component and system manufacturers justify performance indicators such as product specifications and help test equipment manufacturers develop new instruments to keep up with advances in the high-frequency electronics industries.

Research to date in the project has resulted in several publications, including two publications at recent IEEE/ARFTG Microwave Measurement Conferences (in December 2013 and June 2014) and a feature article in IEEE Microwave Magazine (December 2013).

Both the IEEE/ARFTG publications received conference Best Paper awards at the 82nd conference, held at the Ohio State University, Columbus, Ohio, USA, and the 83rd Conference, held in Tampa, Florida, USA. This is the first time in the 40 year history of these conferences that two consecutive conference Best Paper awards have been awarded to the same contributing authors.
This indicates the very high level of quality that has been attained by the research being undertaken in this project.

More information on the EMRP 'HFCircuits' project is available on the project web-site at and the EURAMET website on SIB62.

The picture shows the 1 THz Vector Network Analyser (VNA) system that was used for the measurements reported in the two award-winning ARFTG conference papers. This VNA is situated in the 'Roger Pollard High Frequency Measurement Laboratory' at the University of Leeds. This University is part of the project consortium and is involved primarily in the project's research activities at terahertz frequencies.

World Metrology Day spotlight: Radiation protection makes a difference in sustainability

Sometimes it depends on the perspective. That's why people don't automatically think of radiation protection when it comes to sustainability – but per... more

World Metrology Day 2024

World Metrology Day 2024 is the first officially recognised as a UNESCO International Day more

A robotic arm inside an advanced manufacturing setting

World Metrology Day spotlight: the European Metrology Network for Advanced Manufacturing

Working to address the metrology needs for sustainability in manufacturing across Europe more

Speakers at the UNESCO launch event of the 2024 World Metrology Day - image: Courtesy of BIPM

UNESCO held successful launch event for World Metrology Day 2024

World Metrology Day 2024 focuses on the importance of accurate measurement systems for sustainable solutions more

A blue nebula with bright stars

EMPIR project helps to narrow the search in the hunt for ‘dark matter’

Around 85% of the universe’s matter is ‘invisible’ and can only be detected by its gravitational effect more