News
EMPIR optical project consortium to present at major international conference
ASPEN 2019: 8th International Conference of Asian Society for precision Engineering and Technology, Japan, 12 – 15 November
The Project
EMPIR project ‘Reference algorithms and metrology on aspherical and freeform lenses’ (15SIB01, FreeFORM) is working to develop new measurement capabilities to routinely measure aspherical and freeform optical surfaces at a precision of less than 30 nanometres. These surfaces are used in a variety of optical systems, from medical imaging to astronomy.
The conference
Results from the project will be presented at ASPEN2019, the 8th International Conference of Asian Society for precision Engineering and Technology.
The conference will focus on precision engineering, nanotechnology and manufacturing industries in Asia, and important field for future research.
Project partners will present a talk entitled ‘A reference based data method for the evaluation of aspherical and freeform fitting algorithms’.
Conference topics
Conference topics will include:
- Metrology
- Micro/Nano Fabrication Processes
- Molding and Forming Technology
- Nano/Bio Technology
- Non-traditional Manufacturing Processes
- Optical Applications
- Precision Machine Design
- Service Engineering
- Surface Properties and Characterization
- Other Topics Related to Precision Engineering
This EMPIR project is co-funded by the European Union's Horizon 2020 research and innovation programme and the EMPIR Participating States.
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Information
- EMPIR,
- SI Broader Scope / Integrated European Metrology,
Developing a metrologically-based field assessment of glare and obtrusive light more
Standardising industrial procedures for the magnetic properties of devices leading to the improved quality of a wide variety of products more
Implementing quantum-based pressure measurement techniques in European industries more
Developing reference materials for mass spectroscopy to monitor radioactive and stable isotope pollution in the environment more
Development of the metrological network needed to realise and implement 6G technology more