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Characterization of DAC Phase Offset in IEC 61850-9-2 Calibration Systems

Agustoni, M. (Federal Institute of Metrology METAS, Bern-Wabern, Switzerland) and Frigo, G.
Keywords:

Digital-to-analog converter (DAC) phase offset,discrete Fourier transform (DFT) interpolation, IEC 61850, phasereference signal (PRS), sampled values (SVs)

Document typeArticle
Journal title / SourceIEEE Transactions on Instrumentation and Measurement
Volume70
Page numbers / Article number1-10
Publisher's nameInstitute of Electrical and Electronics Engineers (IEEE)
Publication date 2021
ISSN0018-9456, 1557-9662
DOI10.1109/TIM.2021.3084294
LanguageEnglish

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