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A calibration procedure for electronic calibration units

Stenarson, J (SP Technical Research Institute of Sweden, Boras, Sweden), Eio, C (NPL Teddington, UK) and Yhland, K (SP Technical Research Institute of Sweden, Boras, Sweden)
Keywords:

Vector Network Analyzer (VNA), calibration, metrology, uncertainties, ripple technique

Document typeProceeding
Journal title / Source84th ARFTG Microwave Measurement Conference
Peer-reviewed articleYes
Volume84
Issuen/a
Page numbers / Article numbern/a
Publisher's nameIEEE
Publisher's address (city only)Melville
Publication date 2015-01-19
Conference name84th ARFTG Microwave Measurement Conference
Conference date04-12-2014 to 05-12-2015
Conference placeBoulder, Colorado, USA
ISSNn/a
DOI10.1109/ARFTG.2014.7013414
ISBN978-1-4799-7085-8
Web URLhttp://ieeexplore.ieee.org/document/7013414/
LanguageEnglish

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