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Using Electromagnetic Modeling to Evaluate Uncertainty in a Millimeter-wave Cross-guide Verification Standard

Huang, H. (National Institute of Metrology, Bejing, China), Ridler, N. M. (National Physical Laboratory, Teddington, United Kingdom) and Salter, M. J. (National Physical Laboratory, Teddington, United Kingdom)
Keywords:

Uncertainty, Traceability, Cross-guide, Transmission loss measurements, Verification standard, Electromagnetic modeling, Millimeter-wave measurements.

Document typeProceeding
Journal title / Source83rd ARFTG Microwave Measurement Conference (ARFTG), 2014
Peer-reviewed articleYes
VolumeN/A
IssueN/A
Page numbers / Article numberN/A
Publisher's nameInstitute of Electrical and Electronics Engineers (IEEE)
Publisher's address (city only)New York, USA
Publication date 2014-06-6
Conference name83rd ARFTG Microwave Measurement Conference (ARFTG)
Conference date06-06-2014 to 06-06-2014
Conference placeTampa, Florida, USA
ISSNN/A
DOI10.1109/ARFTG.2014.6899523
ISBNN/A
Web URLhttp://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=6899523
LanguageEnglish

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