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A New Technique for Vector Network Analyzer Calibration Verification Using a Single Reconfigurable Device

Papantonis, S. (Imperial College, London, United Kingdom), Ridler, N. M. (National Physical Laboratory, Teddington, United Kingdom) and Lucyszyn, S. (Imperial College, London, United Kingdom)
Keywords:

Waveguide, measurement, verification device, VNA, millimeter-wave, terahertz, reconfigurable/tunable.

Document typeProceeding
Journal title / Source82nd ARFTG Microwave Measurement Conference, 18-21 Nov. 2013
Peer-reviewed articleYes
VolumeN/A
IssueN/A
Page numbers / Article numberN/A
Publisher's nameInstitute of Electrical and Electronics Engineers (IEEE)
Publisher's address (city only)New York, USA
Publication date 2013-11-18
Conference name82nd ARFTG Microwave Measurement Conference
Conference date18-11-2013 to 21-11-2013
Conference placeColumbus, Ohio, USA
ISSNN/A
DOI10.1109/ARFTG-2.2013.6737352
ISBNN/A
Web URLhttp://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=6737352
LanguageEnglish

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