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Impact of Microwave Measurement Uncertainty on the Nonlinear Embedding Procedure

Bosi, G. (KU Leuven & University of Ferrara), Raffo, A. (University of Ferrara), Avolio, G. (KU Leuven), Schreurs, D. (KU Leuven) and Humphreys, D. A. (National Physical Laboratory)
Keywords:

Microwave measurements uncertainty, microwave transistors, nonlinear embedding, power amplifiers, vector-calibrated nonlinear measurements.

Document typeProceeding
Journal title / SourceN/A
Peer-reviewed articleYes
VolumeN/A
IssueN/A
Page numbers / Article number1-4
Publisher's nameIEEE
Publisher's address (city only)Piscataway
Publication date 2016-05-27
Conference name87th ARFTG Microwave Measurement Conference
Conference date27-05-2016
Conference placeSan Francisco, CA, USA
ISSNN/A
ISBN978-1-5090-1308-1
Web URLhttp://www.arftg.org/
LanguageEnglish
Persistent IdentifierIEEE Catalog Number: CFP16ARF-ART

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