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A Method for De-Embedding Cable Flexure Errors in S-parameter Measurements

Mubarak, F.A. (Van Swinden Laboratorium (VSL), Thijsseweg 11, 2629 JA Delft, The Netherlands), Rietveld, G. (Van Swinden Laboratorium (VSL), Thijsseweg 11, 2629 JA Delft, The Netherlands) and Spirito, M. (Delft University of Technology, Faculty of Electrical Engineering, Delft, The Netherlands)
Keywords:

Index Terms — S-parameters, cable errors, VNA, PNA, cable flexure, impedance, de-embedding, measurement techniques, RF.

Document typeProceeding
Journal title / SourceMicrowave Measurement Conference (ARFTG), 2014
Peer-reviewed articleYes
Volumen/a
Issue83rd ARFTG proceedings
Page numbers / Article number1-5
Publisher's nameIEEE
Publisher's address (city only)n/a
Publication date 2014-06-6
ISSNn/a
DOI10.1109/ARFTG.2014.6899529
LanguageEnglish

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