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Characterizing Cable Flexure Effects in S-parameter Measurements

Mubarak, F.A. (Van Swinden Laboratorium (VSL), Thijsseweg 11, 2629 JA Delft, The Netherlands), Rietveld, G. (Van Swinden Laboratorium (VSL), Thijsseweg 11, 2629 JA Delft, The Netherlands), Hoogenboom, D. (Van Swinden Laboratorium (VSL), Thijsseweg 11, 2629 JA Delft, The Netherlands) and Spirito, M. (Delft University of Technology, Faculty of Electrical Engineering, Delft, The Netherlands)
Keywords:

VNA, PNA, S-parameters, cable effects, cable flexure, impedance, de-embedding, measurement, measurement techniques.

Document typeProceeding
Journal title / SourceMicrowave Measurement Conference, 2013 82nd ARFTG
Peer-reviewed articleYes
Volumen/a
Issue82nd ARFTG proceedings
Page numbers / Article number1-7
Publisher's nameIEEE
Publisher's address (city only)n/a
Publication date 2013-11-18
ISSNn/a
DOI10.1109/ARFTG-2.2013.6737336
LanguageEnglish

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