Traceable industrial 3D roughness and dimensional measurement using optical 3D microscopy and optical distance sensors
Developing methods and guidance to support use of optical surface measurement technologies in advanced manufacturing processes
Surface Topography: Metrology and Properties
Journal of Computational Physics
Applied Optics
Surface Topography: Metrology and Properties
Optical Engineering
Advanced Photonics Nexus
Optics and Lasers in Engineering
Modeling Aspects in Optical Metrology IX
Modeling Aspects in Optical Metrology IX
euspen’s 23rd International Conference & Exhibition
Proceedings 23rd euspen International Conference and Exhibition
Journal of the Optical Society of America B
Optical Engineering
Applied Optical Metrology IV - Proc. of SPIE
Participating EURAMET NMIs and DIs
CEM (Spain)
DFM (Denmark)
GUM (Poland)
INRiM (Italy)
LNE (France)
MIKES (Finland)
PTB (Germany)
RISE (Sweden)
VSL (Netherlands)
Other Participants
Alicona Imaging GmbH (Austria)
Centro Ricerche Fiat S.C.p.A. (Italy)
Friedrich-Alexander-Universität Erlangen - Nürnberg (Germany)
Fundacion Tekniker (Spain)
Gesellschaft für Bild- und Signalverarbeitung (GBS) mbH (Germany)
OST Ostschweizer Fachhochschule (Switzerland)
Technische Universitaet Chemnitz (Germany)
Technische Universitaet Clausthal (Germany)
Technische Universität Kaiserslautern (Germany)
The University of Nottingham (United Kingdom)
twip optical solutions GmbH (Germany)
Universitaet Kassel (Germany)
Universitaet Leipzig (Germany)
Universitaet Stuttgart (Germany)
Zygo Corporation (United States)
Information