Virpi Korpelainen

Positions and Memberships

Coordinator Programm
Supplementary comparison on Nanometrology Standards Technical Committee
Comparison for modern microscopes at research laboratories (Nordic-nano2: Step height) Technical Committee
Traceable three-dimensional nanometrology EMPIR
Traceability of localised functional properties of nanostructures with high speed scanning probe microscopy EMPIR
EMN Member - Expert
Mathematics and Statistics
EMN Section Member - Expert
Advanced Materials (EMN Advanced Manufacturing)