Evaluation of EMI Effects on Static Electricity Meters
Wright P.S., Rietveld G., Leferink F., van den Brom H.E., Alonso F.R.I, Braun J.P., Ellingsberg K., Pous M., Svoboda M.Keywords:
Electromagnetic Compatibility, EMC immunity testing, energy measurement, static meters, standards, watthour meters.
| Document type | Article |
| Journal title / Source | 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) |
| Publisher's name | IEEE |
| Publication date | 2018-7 |
| DOI | 10.1109/CPEM.2018.8500945 |
| Web URL | https://zenodo.org/record/3587786#.XiGxp3u7KUn |
| Language | English |