News

Reliable and accurate methods for data quality in sensor networks

Lowering measurement uncertainty and improving SI-traceability
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Developing the knowledge required to extend Europe’s digital landscape

Extending the performance of digitisers beyond the current state-of-the-art
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Completed EMPIR project continues to make a difference to large-scale measurements for geodesy

Contributing to a better understanding of globally important environmental changes
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Project develops optical material properties for photonics and semiconductor industry

Providing the foundation for nano electronic devices, high quality sensors and photovoltaic cells
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Guidance for optical surface texture and dimensional measurement technologies used in manufacturing

EMPIR project supports improvements in advanced manufacturing processes
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New Chair and Vice-Chairs for the European Metrology Network for Advanced Manufacturing

Fernando Araujo de Castro (NPL, UK) is new Chair and teams up with Vice-Chairs and Secretary for next steps in the network’s ...
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Advanced Manufacturing network publishes first Strategic Research Agenda

The European Metrology Network for Advanced Manufacturing is delighted to announce the formal publication of the first issue ...
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World Metrology Day spotlight: the European Metrology Network for Advanced Manufacturing

Working to address the metrology needs for sustainability in manufacturing across Europe
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An EMPIR project provides new insight on topologically-protected spin structures

Potential to form improved memory storage and novel microwave devices: Skyrmions, nanosized magnetic vortexe. ...
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EMPIR project video of dynamic tracking with six degrees of freedom using photogrammetry available

Supporting automated and reconfigurable manufacturing systems
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