Metrological Assessment and Simulation of Charge Injection Phenomena in CMOS Electronic Switches
Trinchera B., Durandetto P., Iuzzolino R.Circuits,Switches,Capacitors,Semiconductor device modeling,Integrated circuit modeling,Clocks,Accuracy,Voltage measurement,Voltage,Logic gates
| Document type | Article |
| Journal title / Source | IEEE Transactions on Instrumentation and Measurement |
| Volume | 74 |
| Page numbers / Article number | 1-11 |
| Publisher's name | Institute of Electrical and Electronics Engineers (IEEE) |
| Publisher's address (city only) | Piscataway, NJ, United States |
| Publication date | 2025-1-1 |
| ISSN | 0018-9456,1557-9662 |
| DOI | 10.1109/TIM.2025.3637972 |