The spectrometric practical voltage: determination of X-ray tube voltage up to 300 kV by in-beam X-ray spectrometry with a cadmium telluride detector
Šolc J., Pojtinger S., Šmoldasová J., Sochor V., Rusňák J.CdTe detector, in-beam X-ray spectrometry, metrology, photon fluence spectrum, spectrum end-point, MCNP simulation, energy calibration, practical peak voltage, high-frequency generators
| Document type | Article |
| Journal title / Source | Journal of Instrumentation |
| Volume | 20 |
| Issue | 02 |
| Page numbers / Article number | P02013 |
| Publisher's name | IOP Publishing |
| Publisher's address (city only) | Bristol, United Kingdom |
| Publication date | 2025-2-12 |
| ISSN | 1748-0221 |
| DOI | 10.1088/1748-0221/20/02/P02013 |
| Language | English |