Thermometry with embedded SI traceability for industrial applications
Pearce J., Kjeldsen H., Nielsen J., Mueller I., Krause C., Sutton G., Fateev A., Andreu A.Temperature, thermometry, primary thermometry, kelvin, phosphor thermometry, thermal imaging, thermocouples
| Document type | Article |
| Journal title / Source | EPJ Web of Conferences |
| Volume | 323 |
| Page numbers / Article number | 20240453 |
| Publisher's name | EDP Sciences |
| Publisher's address (city only) | London |
| Publication date | 2025-1-1 |
| DOI | 10.1051/epjconf/202532307001 |