Data underlying: "Method to traceably determine the refractive index by measuring the angle of minimum deviation"
Kuiper M., Koops R., Nieuwland R., van der Pol E.refractive index, fused silica, minimum deviation, uncertainty budget
| Document type | Datasets |
| Journal title / Source | Zenodo |
| Volume | - |
| Page numbers / Article number | - |
| Publisher's name | Zenodo |
| ISSN | - |
| Web URL | https://zenodo.org/record/7462433#.Y-uPxnbMJaQ |
| Persistent Identifier | https://zenodo.org/record/7462433 |