Degradation characterization of induced junction photodiodes under ultraviolet irradiation
Kilpeläinen A., Manoocheri F., Edhborg F., Källberg S., Koybasi O., Bardalen E., Werner L., Gran J., Ikonen E.stability, UV irradiation hardness, induced junction photodiode, PQED, chipS·CALe photodiodes, Qu-candela photodiodes
| Document type | Article |
| Journal title / Source | Metrologia |
| Volume | 63 |
| Issue | 2 |
| Page numbers / Article number | 025006 |
| Publisher's name | IOP Publishing |
| Publisher's address (city only) | Bristol, United Kingdom |
| Publication date | 2026-1-1 |
| ISSN | 0026-1394,1681-7575 |
| DOI | 10.1088/1681-7575/ae4c8f |