Measurement of wettability and surface roughness for metrology and quality control in microfluidics
Daugbjerg T., Crouzier L., Delvallée A., Ogheard F., Pecnik C., Romieu K., Saraiva F., Batista E.Microfluidics / wettability / surface roughness / metrology / quality control / standardisation
| Document type | Article |
| Journal title / Source | International Journal of Metrology and Quality Engineering |
| Volume | 16 |
| Page numbers / Article number | 2 |
| Publisher's name | EDP Sciences |
| Publisher's address (city only) | Les Ulis cedex A, France |
| Publication date | 2025-1-20 |
| ISSN | 2107-6847 |
| DOI | 10.1051/ijmqe/2024021 |
| Language | English |