Metrological validation of a deep learning pipeline for in-line detection and dimensional quantification of three-dimensional surface defects
Catalucci S., Savio E.Defect detection, Deep learning, Dimensional measurement, Metrological validation, Die-casting
| Document type | Article |
| Journal title / Source | CIRP Journal of Manufacturing Science and Technology |
| Volume | 64 |
| Page numbers / Article number | 107-119 |
| Publisher's name | Elsevier BV |
| Publisher's address (city only) | Amsterdam, NX, Netherlands |
| Publication date | 2026-1-1 |
| ISSN | 1755-5817 |
| DOI | 10.1016/j.cirpj.2025.12.002 |