Temperature drift compensation in Fourier-transform integrated micro-spectrometers
Velasco A. V., Galindo-Santos J., Cheben P., Calvo M. L, Schmid J., Delage A., Xu D.-X., Janz S., Corredera P.integrated optics, spectroscopy, Fourier transform, Silicon on insulator, temperature drift, spectral retrieval.
| Document type | Article |
| Journal title / Source | Optica Pura y Aplicada |
| Peer-reviewed article | 1 |
| Volume | 48 |
| Issue | 4 |
| Page numbers / Article number | 283-289 |
| Publisher's name | SEDOPTICA |
| Publisher's address (city only) | MADRID |
| Publication date | 2015-12-1 |
| ISSN | - |
| DOI | 10.7149/OPA.48.4.283 |
| Web URL | - |
| Language | Spanish |