Surface mapping of field induced piezoelectric strain at elevated temperatures employing full-field interferometry
Stevenson TS, Quast TQ, Bartl GB, Schmitz-Kempen TSK, Weaver PMWDocument type | Article |
Journal title / Source | IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control |
Peer-reviewed article | 1 |
Volume | 62 |
Issue | 1 |
Page numbers / Article number | 88-96 |
Publisher's name | Institute of Electrical and Electronics Engineers (IEEE) |
Publication date | 2015-1 |
ISSN | 0885-3010 |
DOI | 10.1109/TUFFC.2014.006683 |
Web URL | http://ieeexplore.ieee.org/document/7002928/?arnumber=7002928 |
Language | English |