A More Accurate Measurement of the28Si Lattice Parameter
Mana G., Sasso C. P., Massa E., Mana GiovanniError analysis, Optical interferometers,Temperature measurement, Laser beams. Lattice constants. X-ray diffraction. X-ray interferometry. interferometers, Electric measurements
Document type | Article |
Journal title / Source | Journal of Physical and Chemical Reference Data |
Volume | 44 |
Issue | 3 |
Page numbers / Article number | 031208 |
Publisher's name | AIP Publishing |
Publication date | 2015-9 |
ISSN | 0047-2689, 1529-7845 |
DOI | 10.1063/1.4917488 |
Language | English |