Full characterization of optical Transition-Edge Sensor by impedance spectroscopy measurements in a bandwidth extending to 1 MHz

Lolli L, Taralli E, Monticone E, Rajteri M, Callegaro L, Numata T, Fukuda D
Keywords:

transition edge sensors, quantum metrology, single photon detectors

Document type Proceedings
Journal title / Source IEEE
Peer-reviewed article 1
Volume n/a
Issue n/a
Page numbers / Article number 1-4
Publisher's name IEEE
Publisher's address (city only) New York
Publication date 2013-7-7
Conference name IEEE 14th International Superconductive Electronics Conference
Conference date 07-07-2013 to 11-07-2013
Conference place Cambridge, Masachussetts
ISSN n/a
DOI 10.1109/ISEC.2013.6604291
ISBN 978-1-4673-6369-3
Web URL http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=6604291&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D6604291
Language English

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