Full characterization of optical Transition-Edge Sensor by impedance spectroscopy measurements in a bandwidth extending to 1 MHz
Lolli L, Taralli E, Monticone E, Rajteri M, Callegaro L, Numata T, Fukuda Dtransition edge sensors, quantum metrology, single photon detectors
Document type | Proceedings |
Journal title / Source | IEEE |
Peer-reviewed article | 1 |
Volume | n/a |
Issue | n/a |
Page numbers / Article number | 1-4 |
Publisher's name | IEEE |
Publisher's address (city only) | New York |
Publication date | 2013-7-7 |
Conference name | IEEE 14th International Superconductive Electronics Conference |
Conference date | 07-07-2013 to 11-07-2013 |
Conference place | Cambridge, Masachussetts |
ISSN | n/a |
DOI | 10.1109/ISEC.2013.6604291 |
ISBN | 978-1-4673-6369-3 |
Web URL | http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=6604291&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D6604291 |
Language | English |