Analytical Jacobian and its application to tilted-wave interferometry
Fortmeier I., Stavridis M., Wiegmann A., Schulz M., Osten W., Elster C.Geometric optics : Mathematical methods (general), Interferometry, Metrology, Aspherics
Document type | Article |
Journal title / Source | Optics Express |
Volume | 22 |
Issue | 18 |
Page numbers / Article number | 21313-21325 |
Publication date | 2014-8 |
Web URL | http://www.opticsinfobase.org/oe/abstract.cfm?uri=oe-22-18-21313 |