Fabrication and Analogue Applications of NanoSQUIDs Using Dayem Bridge Junctions
Hao L, Gallop J. C., Cox D. C., Chen JSQUIDs, Junctions, Niobium, Temperature measurement, Noise, Critical current density (superconductivity), Temperature
Document type | Article |
Journal title / Source | IEEE Journal of Selected Topics in Quantum Electronics |
Peer-reviewed article | 1 |
Volume | 21 |
Issue | 2 |
Page numbers / Article number | 9100108 |
Publisher's name | IEEE |
Publisher's address (city only) | New York |
Publication date | 2014-9-5 |
ISSN | 1077-260X |
DOI | 10.1109/JSTQE.2014.2354634 |
Web URL | http://ieeexplore.ieee.org/document/6892955/ |
Language | English |