Fabrication and Analogue Applications of NanoSQUIDs Using Dayem Bridge Junctions

Hao L, Gallop J. C., Cox D. C., Chen J
Keywords:

SQUIDs, Junctions, Niobium, Temperature measurement, Noise, Critical current density (superconductivity), Temperature

Document type Article
Journal title / Source IEEE Journal of Selected Topics in Quantum Electronics
Peer-reviewed article 1
Volume 21
Issue 2
Page numbers / Article number 9100108
Publisher's name IEEE
Publisher's address (city only) New York
Publication date 2014-9-5
ISSN 1077-260X
DOI 10.1109/JSTQE.2014.2354634
Web URL http://ieeexplore.ieee.org/document/6892955/
Language English

Back to the list view