Absolute calibration of a charge-coupled device camera with twin beams

Meda A., Ruo-Berchera I., Degiovanni I.P., Brida G., Rastello M.L., Genovese M.
Keywords:

Charge-Coupled Device (CCD), calibration, mesoscopic regime, spontaneous parametric down conversion

Document type Article
Journal title / Source Applied Physics Letters
Peer-reviewed article 1
Volume 105
Issue 10
Page numbers / Article number 101113
Publisher's name AIP
Publisher's address (city only) New York
Publication date 2014-9-12
ISSN 0003-6951
DOI 10.1063/1.4895665
Web URL http://scitation.aip.org/content/aip/journal/apl
Language English

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