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• Current and potential liaisons for ISO/TC 229
• Artificial gratings used in nanotechnology-description and measurement of dimensional quality parameters
• Low-cost interferometric compensation of geometrical errors of CMMs
• Interferometric step-height measurements at different lambdas

• High accuracy laser diffractometer: Angle-scale traceability by error separation method with a grating
• Industrial Computed X-ray Tomography - recent developments at PTB
• Uncertainty studies for diameter measurements with CMM
• FP7 SEA-EU-NET Project and Task 2.6: MSTQ (metrology, standardisation, testing and quality system)
• Uncertainty calculation using Monte Carlo method
• Gauge blocks - Uncertainty for the variation in length
• Matus - example Mathematica notebook
• Matus - example Mathematica notebook-1D
• Matus - example Mathematica notebook-1D uniform
• Traceability of NMi F25-microCMM
• NPL-Hexagon Primary Length Bar Interferometer

• JRP1.1 - Nano particles
• JRP1.2 - Probe Sample Interactions in Dimensional Nanometrology
• JRP1.3 - Challenging Dimensional Quantities at Nanoscale
• JRP1.4 - New Traceability Routes for Nanometrology
• JRP2.1 - Towards truly 3D metrology for advanced micro-parts
• JRP2.2 - Metrology for new industrial measurement technologies
• JRP3.1 - Absolute long distance measurement in air
• JRP4.1 - Cutting Edge 3D Form Metrology
• JRP1.4 poster
• JRP3.1 poster

• Arcuate arm profilometry - traceable metrology for large optics
• fs comb implementation and measurements
• Basics of highest accuracy roundness measurement
• Improvement of counting interferometer fringe interpolation
• Graphic method for fractional fringe evaluation
• MIKES new metrology building
• Traceability of Laser Frequency Calibrations at MIKES

• Nanometrology at PTB
• Traceability in nanometrology by direct coupling of an AFM and an optical interferometer
• Ultraprecision µCMM using a low force 3D touch probe
• IMGC on-going activities in nanometrology
• Critical dimension metrology using Optical Diffraction Microscopy
• Standardisation efforts in nanotechnology and nanometrology
• Uncertainty Evaluation for the Thermal Expansion Coefficient
• (Example Excel file)
• Traceable atomic force microscopy at MIKES
• Nanometrology project at LNE

• Roughness standards; gauge block interferometer; software for roundness measurements; system for calibration of precise line scales
• Compensation of the optical non-linearity of heterodyne interferometers
• Applications of MIKES' combined white light and 633 nm He-Ne light interferometer
• Current state of our QS Supporting CMCs for length and angle
• Verification artefacts for Vision Inspection machines & non-contacting measuring systems 1 µm to 2 m
• An acoustic method for determination of the effective temperature and refractive index of air
• Design of CMI long gauge block interferometer
• Angle measurements at IMGC
• Dimensional-colorimetric stereovision measurements of cultural heritage
• Development of acetylene stabilised laser at 1542 nm

• Line scale interferometer software
• Comparison of gauge block measuring software
• Reflections on additional corrections on air pressure at interferometric measurements of gauge blocks
• Accompanying Excel spreadsheet

• Development of reference standards for thickness of films in the nanometre range
• First experiences with the comb generator at BEV
• Development of an automated gauge block measurement system
• Reflections on additional corrections on air pressure at interferometric measurements of gauge blocks
• Accompanying Excel spreadsheet
• The NPL Small CMM
• Novel design of a one-dimensional measurement probe
• The NPL laser tracker multilateration CMM
• Upgrade and comparision of 3 m long Straightness Standard
• Calibration of a 7-sided polygon
• Overview of developments in CMI length section
• Report on activities in our length laboratory

• Addendums to the GUM
• Paper on Measurement Uncertainty and the propagation of distributions
• Influence of temperature gradient in air for laser length measurements
• Optical measurement and uncertainty of focal length of Koesters interferometer
• Uncertainty in form measurements
• 2D uncertainty analysis for sphere diameter measurement (Mathematica application)
• Uncertainty for stylus surface texture measurements
• Uncertainty assessment for CMMs using calibrated workpieces (according to ISO/DTS 15530-3)
• Uncertainty budgets for CMC top services: a comparison of different approaches